Prof. M.P.Kothiyal 's Profile
DESIGNATION
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CURRENT RESEARCH INTEREST
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Professor
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Applied optics, Interferometry, Optical Instrumentation and testing |
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PERSONAL HOME PAGE |
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Recent Publications : |
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- Basanta Bhaduri, N. Krishna Mohan and M.P. Kothiyal
A comparative study of phase shifting algorithms in Digital Speckle Pattern Interferometry
Optik (In- press, available online)
- S. K. Debnath and M. P. Kothiyal
Experimental study of the phase-shift miscalibration error in phase-shifting interferometry:
use of a spectrally resolved white-light interferometer
Applied Optics 46, 5103-5109 (2007)
- Basanta Bhaduri, N. Krishna Mohan and M. P. Kothiyal
Simultaneous measurement of out-of-plane displacement and slope using multi-aperture DSPI system and
fast Fourier transform
Applied Optics 46, 23, 5680-5686(2007).
- Basanta Bhaduri, N. Krishna Mohan and M. P. Kothiyal
(1,N) spatial phase shifting technique in DSPI and DS for NDE
Optical Engineering 46 , 5 051009-1-051009-7 (2007).
- Basanta Bhaduri, M.P. Kothiyal and N. Krishna Mohan
Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shifting
Optics Communication 272 , 9–14 (2007)
- Basanta Bhaduri, N. Krishna Mohan, M. P. Kothiyal and R.S. Sirohi
Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS)
Optics Express 14 ,24 11598-11607 (2006).
- Basanta Bhaduri, N. Krishna Mohan and M.P. Kothiyal
Cycle path digital speckle shear pattern interferometer: Use of polarizing phase shifting method
Optical Engineering 45 , 105604 -1- 6 (2006)
- Basanta Bhaduri, N. Krishna Mohan and M.P. Kothiyal
(5, N) phase shift algorithm for speckle and speckle shear fringe analysis in NDT
Holography and Speckle 3 ,1 18-21 (2006)
- Basanta Bhaduri, N. Krishna Mohan and M.P. KothiyalA TV holo - shearography system for NDE
Lasers in Engineering 16 , 93-104 (2006).
- Basanta Bhaduri, N. Krishna Mohan and M.P. Kothiyal
A dual-function ESPI system for the measurement of out-of-plane displacement and slope
Optics and Lasers in Engineering 44 , 637-644 (2006)
- S. K. Debnath, Nirmal K. V and M. P. Kothiyal
Spectrally-resolved phase- shifting interferometry for accurate group velocity dispersion measurements
Optics Letters 31 , 3098 -3100 (2006).
- S . K. Debnath and M. P. Kothiyal
Improved optical profiling using spectral phase in spectrally resolved white light interferometry
Applied Optics 45 , 6965 -6972 (2006)
- S. K. Debnath, M. P. Kothiyal, J, Schmit, P. Hariharan
Spectrally resolved white -light phase -shifting interference microscopy for thickness -profile
measurements of transparent thin -film layers on patterned substrates
Optics Express 14 , 4662 -4667 (2006)
- S. K. Debnath, M. P. Kothiyal Analysis of spectrally resolved white light interferometry by Hilbert Transform method
Proc. of SPIE, 6292, 62920P (2006)
- S. K. Debnath, M. P. Kothiyal, J, Schmit, P. Hariharan
Spectrally resolved phase-shifting interferometry of transparent thin-films: sensitivity of thicknes measurements
Applied Optics 45 , 8636 -8640 (2006).
- Kaladevi Sendhil , C. Vijayan and M. P. Kothiyal
Low threshold optical power limiting of cw laser illumination based on nonlinear
refraction in zinc tetraphenyl porphyrin
Optics & Laser Technology,38, 512-515 (2006)
- B. Bhaduri , N. Krishna Mohan, M. P. Kothiyal
A dual-function ESPI system for the measurement of out-of-plane displacement and slope
Optics and Laser in Engineering,44, 637 -644(2006)
- Kaladevi Sendhil , C. Vijayan and M. P. Kothiyal
Contrast reversal and enhancement of phase spot array/grid with an intensity dependent
refractive index medium as phase filter
Optics and Laser in Engineering,44, 122-120(2006)
- S. K. Debnath and M. P. Kothiyal
Optical profiler based on spectrally resolved white light interferometry
Opt. Eng., 44, 013606(1-5), (Jan. 2005).
- Kaladevi Sendhil , C. Vijayan and M. P. Kothiyal
Spatial phase filtering with a porphyrin derivative as phase filter in an optical image processor
Optics Communications, 251, 292-298, (2005).
- Kaladevi Sendhil, C. Vijayan and M. P. Kothiyal
Nonlinear optical properties of a porphyrin derivative incorporated in Nafion polymer
Optical Materials, 27, 1606-1609, (2005).
- M. P. Kothiyal
Interferomatric Surface Metrology with White Light
(Invited Talk), International Conference on Laser Applications and Optical Metrology (ICLAOM-03),
Dec. 1-4, New Delhi,172-178 , (2003).
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