Metamaterials (MM) and radio frequency microsystems (RF MEMS) have been extensively studied for novel high-frequency applications over the past two decades. MMs have been introduced to provide unusual transmission properties determined by the negative value, at the same time, of both the dielectric constant and the magnetic permeability. RF MEMS switches are characterized by a well-established advantage of being entirely passive vs. the limitations of insertion loss and signal distortion introduced by pin diodes. The combination of these two technologies will be presented for potential K-band applications, studying two basic structures in coplanar waveguide (CPW) configurations: (i) U-shaped resonators and (ii) Sierpinski triangles. The design principles, their MM nature, and their utilization in arrays will be discussed for both geometries.
Dr. Romolo Marcelli was born in Roma, Italy, on February 26, 1958. He obtained a degree in Physics at the University of Roma "La Sapienza" in 1983. Since 1987 he has been with the National Research Council (CNR) of Italy, currently with the Institute for Microelectronics and Microsystems (IMM) of CNR. Presently, he is a Senior Researcher and Responsible for the Research Line on High-Frequency Microsystems: Technologies and Reliability for Ground and Space Applications at CNR-IMM Roma. He was also Deputy Director at CNR-IMM from October 2006 to May 2014. His past and current interests include technologies, design and modeling, and test activities in Microwave Magnetics and RF MEMS. He is also involved in Microwave Imaging and Metamaterials at Microwave and Millimeter Wave Frequencies.
In this framework, he also managed several national and international industrial and academic contracts and served as an organizer and committee member in workshops and conferences. He is the Editor of two books on the linear and non-linear properties of magnetic microwave devices and co-author of more than two hundred international papers and conference contributions on microwave magnetic devices, RF MEMS, high-frequency metamaterials, and microwave scanning microscopy.